WALTER KOSONOCKY AWARD

Recipients

 

  The IISS Walter Kosonocky Award is presented bi-annually for THE BEST PAPER presented in any venue during the prior two years representing significant advancement in solid-state image sensors. The award commemorates the many important contributions made by the late Dr. Walter Kosonocky to the field of solid-state image sensors. Personal tributes to Dr. Kosonocky appeared in the IEEE Transactions on Electron Devices in 1997.

  Founded in 1997 by his colleagues in industry, government and academia, the award is also funded by proceeds from the International Image Sensor Workshop.  The award committee solicits nominations biennially.  The award is announced and presented at the Workshop.

 

 

Year/Org.

Recipients

Paper

2015

Sony

Shunichi Sukegawa

 

Tsutomu Nakajima

 

Ken Koseki

 

Tsutomu Haruta

 

Koji Fukumoto

 

Keishi Inoue

 

Takashi Nagano

 

Teruo Hirayama

Taku Umebayashi

 

Hiroshi Kawanobe

 

Isao Hirota

 

Masanori Kasai

 

Toshifumi Wakano

 

Hiroshi Takahashi

 

Yoshikazu Nitta

 

Noriyuki Fukushima

 

A 1/4-inch 8Mpixel Back-Illuminated Stacked CMOS Image Sensor

 

ISSCC Dig. Tech. Papers, pp. 484 - 485, Feb. 2013.

2013

NHK

 

Shizuoka University

Kazuya

Kitamura

 

Toshihisa

Watabe

 

Takehide

Sawamoto

 

Tomohiko

Kosugi

 

Tomoyuki

Akahori

 

Tetsuya

Iida

 

Keigo

Isobe

 

 

 

Takashi

Watanabe

 

Hiroshi

Shimamoto

 

Hiroshi

Ohtake

 

Satoshi

Aoyama

 

Shoji

Kawahito

 

Norifumi

Egami

A 33-Megapixel 120-Frames-Per-Second 2.5-Watt CMOS Image Sensor With Column-Parallel Two-Stage Cyclic Analog-to-Digital Converters

 

IEEE Transactions On Electron Devices, 59(12), December 2012, pp. 3426-3433.

2011

Sony

Hayato

Wakabayashi

 

Keiji

Yamaguchi

 

Masafumi

Okano

 

Souichiro

Kuramochi

 

Oichi

Kumagai

 

Seijiro

Sakane

 

Masamichi

Ito

 

Masahiro

Hatano

 

Masaru

Kikuchi

 

Yuuki

Yamagata

 

 

 

Takeshi

Shikanai

 

Ken

Koseki

 

Keiji

Mabuchi

 

Yasushi

Maruyama

 

Kentaro

Akiyama

 

Eiji

Miyata

 

Tomoyuki

Honda

 

Masanori

Ohashi

 

Tetsuo

Nomoto

A 1/2.3-inch 10.3Mpixel 50 frame/s Back-Illuminated CMOS Image Sensor

 

Proc. 2010 International Solid-State Circuits Conference (ISSCC), pp. 410-411, San Francisco, CA USA February 2010.

2009

Eastman

Kodak

Eric

Stevens

 

Hung

Doan

 

Jeffery

Kyan

 

Gang

Shi

 

Jian

Wu

 

 

 

Hirofumi

Komori

 

Hiroaki

Fujita

 

Christopher

Parks

 

Cristian

Tivarus

Low Crosstalk and Low Dark Current CMOS Image Sensor Technology Using a Hole-Based Detector

 

Proc. International Solid-State Circuits Conference (ISSCC),  pp.59-61 San Francisco, California USA February 2008.

2007

Sony

 

Satoshi

Yoshihara

 

Yoshikazu

Nitta

 
Masaru

Kikuchi

 

Ken

Koseki

 

Yoshiharu

Ito

 

Yoshiaki

Inada

 

Souichiro

Kuramochi

 

Hayato

Wakabayashi

 

Masafumi

Okano

 

Hiromi

Kuriyama

 

Junichi

Inutsuka

 

Akari

Tajima

 

Tadashi

Nakajima

 

Yoshiharu

Kudoh

 
Fumihiko

Koga

 

Yasuo

Kasagi

 

Shinya

Watanabe

 

Tetsuo

Nomoto

 

A 1/1.8” 6.4 Mpixel 60 frames/s CMOS image sensor with seamless mode change

 

IEEE J. of Solid-State Circuits, vol. 41(12) December 2006 pp. 2998-3006

2005

Micron Technology

Alex

Krymski

 

Nail

Khaliullin

 

 

 

 

Howard

Rhodes

 

A 2 Electron noise, 1.3. Megapixel CMOS Sensor

 

Proc. 2003 IEEE Workshop on CCDs and Advanced Image Sensors, May 15-17, 2003 Bavaria, Germany

 

2003

Texas Instruments

Jaroslav

Hynecek

 

Impactron – A New Solid State Image Intensifier

 

IEEE Trans. Electron Devices, vol. 48(10) Oct. 2001 pp. 2238-2241

 

2001

Fujifilm

Tetsuo

Yamada

 

Katsumi

Ikeda

 

Yong-Gwan

Kim

 

Hideki

Wakoh

 

Tetsuo

Toma

 

Tomohiro

Sakamoto

 

 

 

 

Kazuki

Ogawa

 

Eiichi

Okamoto

 

Kazuyuki

Masukane

 

Kazuya

Oda

 

Masafumi

Inuiya

 

A Progressive Scan CCD Image Sensor for DSC Applications

 

IEEE J. Solid-State Circuits, vol. 35(12) Dec. 2000 pp. 2044-2054

1999

Philips

Jan

Bosiers

 

Agnes

Kleimann

 

Arjen

Vander Sijde

 

Laurens

Korthout

 

Daniel

Verbugt

 

Herman

Peek

 

Edwin

Roks

 

Anco

Heringa

 

Frans

Vledder

 

Peter

Opmeer

A 2/3” 2M pixel progressive scan FT-CCD for digital still camera applications

 

Proc. 1998 IEEE International Electron Devices Meeting, pp. 37-40