Proceedings index

1997 IEEE Workshop on

Charge-Coupled Devices &

Advanced Image Sensors

Proceedings index

Papers should be cited as:

Author, Title, in Proc. 1997 IEEE Workshop on CCDs and Advanced Image Sensors, June 5-7, 1997 Bruges, Belgium.

Title	Authors	Affiliation
A High Performance 5V-Only l/5-Inch 220k-Pixel CCD Image Sensor	T. Watanabe, E. Koyama, K. Yamamoto, E. Akaike, S. Takano, T. Inoue, K. Okada, T. Kawasaki, H. Urabe, H. Adachi, J. Nakai, K. Misawa	Sharp Corporation, Nara, Japan
Low Noise and High Speed Charge Detection in High Resolution CCD Image Sensors	J. Hynecek	Texas Instruments Inc., Dallas, TX, USA
Characterization of building block imagers with respect to linear dynamic range	H. Folkerts, E. Roks, L. Korthout, A. Theuwissen	Philips Imaging Technology, Eindhoven, The Netherlands
CCD-Based Magnetic Field Imaging	N. 0, A. Nathan*	DALSA INC., Waterloo, ON, Canada. * University of Waterloo, Waterloo, ON, Canada
A 1/4 Inch 330k Square Pixel Progressive Scan CMOS Active Pixel Image Sensor	M. Sasaki, E. Oba, K. Mabuchi, N. Tanaka, Y. Iida, R. Miyagawa	ULSI Research Laboratories, Toshiba Corporation, Kawasaki, Japan
An Experimental 4K x 2K Color Video Pickup System Based on CMD Imagers	K. Mitani, Y. Fujita, H. Shimamoto	NHK (Japan Broadcasting Corporation), Tokyo, Japan
Fast CMOS Imaging with High Dynamic Range	J. Huppertz, R. Hauschild, B. Hosticka, T. Kneip, S. Muller*, M. Schwarz	Fraunhofer Institut of Microelectronic Circuits and Systems, Duisburg, Germany. * Gerhard-Mercator-University, Duisburg, Germany
A bipolar imager with bipolar field memory	M. Shinohara, S. Sugawa, Y. Nakamura, T. Ohmi*	Canon Inc., Kanagawa Japan. * Tohoku University, Sendai, Japan
A 3.30x2.95 mm² l/6-inch 250k-pixel IT-CCD image sensor	A. Asai, Y. Toumiya, K. Matsuzaki, K. Nigawara, S. Kitayama, Y. Wataya, K. Masuda	SONY Corporation, Kanagawa, Japan. * SONY Kokubu Corporation, Kagoshima, Japan
Technology and Performance of VGA FT-Imagers with Double and Single Layer Membrane Poly-Si Gates	H. Peek, D. Verbugt, J. Maas, M. Beenhakkers	Philips Imaging Technology, Eindhoven, The Netherlands
Design and Processing Aspects of a Sixteen Tap, 32 Sector, 50 Megapixel Full Frame Image Sensor	M. Farrier, C. Smith, W. Pfister*	DALSA INC., Waterloo, ON, Canada. * Recon-Optical Inc., Barrington, IL, USA
A model for the diffusion behaviour of generation centers in CCDs	W.J. Toren, J. Bisschop*	Philips Imaging Technology, Eindhoven, The Netherlands. * Philips Semiconductors, Nijmegen, The Netherlands
Near-100% fill factor standard CMOS active pixels	B. Dierickx, G. Meynants, D. Scheffer	IMEC, Leuven, Belgium
Frame-Transfer CMOS Active Pixel Sensor With Pixel Binning	Z. Zhou, B. Pain, E. Fossum*	Jet Propulsion Laboratory, Pasadena, CA, USA. * Photobit, La Crescenta, CA, USA
A novel photoswitch image sensor	R. Dyck, J. Pinter, T. Selbo, S. Onishi, D. Xiao, L. Haynes, H. Brown*	Lockheed Martin Fairchild Defense Systems, Milpitas, CA, USA. * Intelligent Automation, Inc., Rockville, MD, USA. ** Wright Laboratories, Tyndall AFB, FL, USA
Leakage current reduction of large-area silicon microstrip sensors	W. Tsay, Y. Chen, L. Laih, J. Hong, A. Chen, W. Lin, y. Chang, S. Hou, J. Tang, C. Chio, S. Chiang, H. Ting	National Central University, Taiwan PAPER NOT PRESENTED
An Image Sensor using Quad Tree for Selective Scanning with Adaptive Resolution	J. Akita, K. Asada	University of Tokyo, Tokyo, Japan
Logarithmic-Converting CCD Line Sensor and Its Noise Characteristics	K. Takada, S. Miyatake	Minolta Co., Ltd., Osaka, Japan
a-Si:H avalanche multiplication p-i-n photodiode films	K. Sawada, H. Manabe, T. Ando	Shizuoka University, Hamamatsu, Japan
CCD cameras for medical X-ray imaging	A. Bruijns, R. Bastiaens, R. Snoeren, H. Reiter*	Philips Medical Systems, Best, The Netherlands. * Philips Research Laboratories, Aachen, Germany
High Responsivity Photodetector on SOI substrate	W. Zhang, M. Chan, S. Fung, P. Ko	Hong Kong University of Science & Technology, Hong Kong
Optical simulation for image sensors by wave analysis	H. Mutoh	Link Research Corporation, Tokyo, Japan
Single Pixel Test Structures for Characterization and Comparative Analysis of CMOS Image Sensors	B. Fowler, D. Yang, H. Min, A. EI Gamal	Stanford University, Stanford, CA, USA
3D Optoelectronic Simulations for CCD Imagers	A. Ruckelshausen, R. Tobergte, P. Thyen	Fachhochschule Osnabruck, Osnabruck, Germany
Anti-Blooming Optimisation using Simulations and Measurements for a VAB Process	G. Weale, M. Kiik, E. Fox, G. Ingram	DALSA INC., Waterloo, ON, Canada
An In-situ Storage Image Sensor (ISIS) with Elongated CCD Storage for a High-speed Video-Camera of One Million pps	T. Etoh, K. Takehara	Kinki University, Osaka, Japan
Reviews on Digital Still cameras (Invited Paper)	M. Konishi, K. Iwabe	Fuji Photo Film Co., Ltd., Saitama, Japan
Offset-free offset correction for Active Pixel Sensors	B. Dierickx, G. Meynants, D. Scheffer	IMEC, Leuven, Belgium
Recent Progress of CMD Imaging	T. Nakamura, K. Saitoh	Olympus Optical Co., Ltd., Nagano, Japan
Wide Intrascene Dynamic Range CMOS APS Using Dual Sampling	O. Yadid-Pecht, E. Fossum*	Jet Propulsion Laboratory, Pasadena, CA, USA. * Photobit, La Crescenta, CA, USA
Driving Voltage Reduction of Shift Registers in IT-CCD Image Sensors	N. Mutoh, S. Kawai, T. Yamada, Y. Kawakami, T. Nakano, K. Orihara, N. Teranishi	NEC Corporation, Kanagawa, Japan
Automated optimisation of FT-CCD Image Pixels	A. Heringa, J. Bosiers, E. Roks	ED&T Services, Philips Research, Eindhoven, The Netherlands. * Philips Imaging Technology, Eindhoven, The Netherlands
A 36 cm² Large Monolythic pn-CCD Detector for X-ray Astronomy	L. Struder, H. Brauninger, U. Briel, R. Hartmann, G. Hartner, D. Hauff, N. Krause, B. Maier, N. Meidinger, E. Pfeffermann, M. Popp, C. Reppin, R. Richter, D. Satter, J. TrUmper, U. Weber, P. Holl, J. Kemmer, H. Soltau, A. Viehl, C. v. Zanthier*	Max-Planck-Institut, Munchen, Germany. * Ketek GmbH, Oberschleissheim, Germany
A Low Smear p-substrate Frame Interline Transfer Sensor with Simplified kTC Noise Reduction	C. Smith, E. Fox, M. Miethig, M. Farrier	DALSA INC., Waterloo, ON, Canada
Active Pixel Image Sensors in 0.35 um CMOS Technology	S. Mendis, A. Budrys, J. Lin, K. Cham	Hewlett Packard, Palo Alto, CA, USA
Pulsed bipolar CMOS imager	T. Delbruck, N. Mascarenhas, M. Chi, A. Bergemont, C. Mead	Synaptics, San Jose, CA, USA. * National Semiconductor, Santa Clara, CA, USA
Design of an Image Sensor with On-Chip Oversampling Analog-to-Digital Conversion	J. Nakamura, T. Nomoto, T. Nakamura, B. Pain, E. Fossum*	Olympus Optical Co., Ltd., Tokyo, Japan. Jet Propulsion Laboratory, Pasadena, CA, USA. *Photobit, LCC., Pasadena, CA, USA
A Single Chip CMOS APS Digital Camera	B. Olson, T. Shaw, B. Pain, R. Paniccaci, B. Mansoorian, R. Nixon, E. Fossum	Jet Propulsion Laboratory, Pasadena, CA, USA. * Photobit, La Crescenta, CA, USA
A 2V Driving Voltage 1/3-inch 410k-pixel Hyper-D Range CCD	T. Yamaguchi, I. Shimizu, K. Henmi, R Tanaka, T. Tanaka, H. Matsumaru, M. Miyashita, I. Ihara, S. Tashiro, M. Yamanaka, Y. Nishi, K. Tachikawa, H. Komobuchi*	Matsushita Electronics Corporation, CCD division, Kyoto, Japan. * Matsushita Electronics Corporation, ULSI Process Techn. Development Center, Kyoto, Japan. ** Matsushita Electric Industrial CO., LTD, Kyoto, Japan.
Development of Back-Illuminated, Fully-Depleted CCD Image Sensors For Use in Astronomy and Astrophysics	S. Holland, R. Stover, M. Wei, G. Goldhaber, D. Groom, W. Moses, C. Pennypacker, S. Perlmutter, N. Wang	Lawrence Berkeley National Laboratory, Berkeley, CA, USA. * University of California Observatories, Lick Observatory
Recent results with Delta-doped CCDs	S. Nikzad, A. Smith, Q. Yu, P. Grunthaner, S. Elliott	Jet Propulsion Laboratory, Pasadena, CA, USA
Non-Linear Output from Image Sensors: Applications, Techniques, and Limitations	E. Fossum	Photobit, La Crescenta, CA, USA.
Megapixel CMOS APS with Analog and Digital Readout	B. Mansoorian, G. Yang, R. Panicacci, C. Wrigley, C. Staller*, B. Pain, E. Fossum	Photobit, La Crescenta, CA, USA. * Jet Propulsion Laboratory, Pasadena, CA, USA. ** Boeing Defense and Space Group, Anaheim, CA, USA
Motion adaptive image sensor	T. Hamamoto, K. Aizawa, M. Hatori	University of Tokyo, Tokyo, Japan
Pixel Parallel and Column Parallel Architectures and their Implementations of On Sensor Image Compression	K. Aizawa, T. Hamamoto, Y. Ohtsuka, M. Hatori, M. Abe*	University of Tokyo, Tokyo, Japan. * NHK, Tokyo, Japan
A Wide Dynamic Range CMOS Image Sensor	R. Ginosar, A. Gnusin	Israel Institute of Technology, Haifa, Israel
Packaging and Operation of Philips 7kx9k CCDs	M. Lesser, D. Ouellette, A. Theuwissen, G. Kreider, H. Michaelis**	Steward Observatory, University of Arizona, Tucson, USA. * Philips Imaging Technology, Eindhoven, The Netherlands. ** DLR, Institut fUr Planetenerkundung
A High Resolution, Low Cost CCD Family of Image Sensors for Digital Camera Applications	S. Bencuya, J. Toker, S. Haque	Polaroid Corporation, Cambridge, MA, USA
The design of a novel GaAs CCD multiplying D/A converter	H. Kwok, L. Chen	University of Victoria, Victoria, BC, Canada
Ultrafast Correlation Image Sensor: Concept, Design, and Applications	S. Ando, T. Nakamura, T. Sakaguchi	The University of Tokyo, Tokyo, Japan