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The Walter
Kosonocky Award For Significant
Advancement in Solid-State Image Sensors
The Walter Kosonocky Award is presented bi-annually for THE BEST PAPER
presented in any venue during the prior two years representing significant
advancement in solid-state image sensors. The award commemorates the many
important contributions made by the late Dr.
Walter Kosonocky to the field of solid-state image sensors. Personal
tributes to Dr. Kosonocky appeared in the IEEE
Transactions on Electron Devices in 1997. Founded in 1997 by his colleagues in industry, government and academia,
the award is also funded by proceeds from the International Image Sensor
Workshop. The award committee is
chaired by Dr. Award Recipients |
|
Year/Org |
Recipient(s) |
Paper Citation |
|
|
1999 Philips |
Jan Bosiers Agnes Kleimann Arjen Vander Sijde Laurens Korthout Daniel Verbugt |
Herman Peek Edwin Roks Anco Heringa Frans Vledder Peter Opmeer |
A 2/3” 2M pixel progressive scan
FT-CCD for digital still camera applications Proc. 1998 IEEE
International Electron Devices Meeting, pp. 37-40 |
|
2001 Fujifilm |
Tetsuo Yamada Katsumi Ikeda Yong-Gwan Kim Hideki Wakoh Tetsuo Toma Tomohiro Sakamoto |
Kazuki Ogawa Eiichi Okamoto Kazuyuki Masukane Kazuya Oda Masafumi Inuiya |
A Progressive Scan CCD Image Sensor for
DSC Applications IEEE J. Solid-State Circuits, vol. 35(12) Dec. 2000
pp. 2044-2054 |
|
2003 |
Jaroslav Hynecek |
|
Impactron – A New Solid State Image
Intensifier IEEE Trans. Electron Devices,
vol. 48(10) Oct. 2001 pp. 2238-2241 |
|
2005 Micron Technology |
Alex Krymski Nail Khaliullin |
Howard |
A 2 Electron noise, 1.3.
Megapixel CMOS Sensor Proc. 2003 IEEE Workshop
on CCDs and Advanced Image Sensors, May 15-17, 2003 Bavaria, |
|
2007 Sony |
Satoshi Yoshihara Yoshikazu Nitta Kikuchi Ken Koseki Yoshiharu Ito Yoshiaki Inada Souichiro Kuramochi Hayato Wakabayashi Masafumi Okano |
Hiromi Kuriyama Junichi Inutsuka Akari Tajima Tadashi Nakajima Yoshiharu Kudoh Koga Yasuo Kasagi Shinya Watanabe Tetsuo Nomoto |
A 1/1.8” 6.4 Mpixel 60
frames/s IEEE J. of Solid-State
Circuits, vol. 41(12) Dec. 2006 pp. 2998-3006 |