The Walter Kosonocky Award

For

Significant Advancement in Solid-State Image Sensors

The Walter Kosonocky Award is presented bi-annually for THE BEST PAPER presented in any venue during the prior two years representing significant advancement in solid-state image sensors. The award commemorates the many important contributions made by the late Dr. Walter Kosonocky to the field of solid-state image sensors. Personal tributes to Dr. Kosonocky appeared in the IEEE Transactions on Electron Devices in 1997.

Founded in 1997 by his colleagues in industry, government and academia, the award is also funded by proceeds from the International Image Sensor Workshop. The award committee is chaired by Dr. Albert Theuwissen and it solicits nominations bi-annually. The award is announced and presented at the Workshop.

Award Recipients

Year/Org	Recipient(s)		Paper Citation
2011 Sony	Hayato Wakabayashi Keiji Yamaguchi Masafumi Okano Souichiro Kuramochi Oichi Kumagai Seijiro Sakane Masamichi Ito Masahiro Hatano Masaru Kikuchi1 Yuuki Yamagata	Takeshi Shikanai Ken Koseki Keiji Mabuchi Yasushi Maruyama Kentaro Akiyama Eiji Miyata Tomoyuki Honda Masanori Ohashi Tetsuo Nomoto	A 1/2.3-inch 10.3Mpixel 50 frame/s Back-Illuminated CMOS Image Sensor Proc. 2010 International Solid-State Circuits Conference (ISSCC), pg. 410-411, San Francisco, CA USA February 2010.
2009 Eastman Kodak	Eric Stevens Hung Doan Jeffery Kyan Gang Shi Jian Wu	Hirofumi Komori Hiroaki Fujita Christopher Parks Cristian Tivarus	Low Crosstalk and Low Dark Current CMOS Image Sensor Technology Using a Hole-Based Detector Proc. International Solid-State Circuits Conference (ISSCC), pp.59-61 San Francisco, California USA February 2008.
2007 Sony	Satoshi Yoshihara Yoshikazu Nitta Masaru Kikuchi Ken Koseki Yoshiharu Ito Yoshiaki Inada Souichiro Kuramochi Hayato Wakabayashi Masafumi Okano	Hiromi Kuriyama Junichi Inutsuka Akari Tajima Tadashi Nakajima Yoshiharu Kudoh Fumihiko Koga Yasuo Kasagi Shinya Watanabe Tetsuo Nomoto	A 1/1.8” 6.4 Mpixel 60 frames/s CMOS image sensor with seamless mode change IEEE J. of Solid-State Circuits, vol. 41(12) Dec. 2006 pp. 2998-3006
2005 Micron Technology	Alex Krymski Nail Khaliullin	Howard Rhodes	A 2 Electron noise, 1.3. Megapixel CMOS Sensor Proc. 2003 IEEE Workshop on CCDs and Advanced Image Sensors, May 15-17, 2003 Bavaria, Germany
2003 Texas Instruments	Jaroslav Hynecek		Impactron – A New Solid State Image Intensifier IEEE Trans. Electron Devices, vol. 48(10) Oct. 2001 pp. 2238-2241
2001 Fujifilm	Tetsuo Yamada Katsumi Ikeda Yong-Gwan Kim Hideki Wakoh Tetsuo Toma Tomohiro Sakamoto	Kazuki Ogawa Eiichi Okamoto Kazuyuki Masukane Kazuya Oda Masafumi Inuiya	A Progressive Scan CCD Image Sensor for DSC Applications IEEE J. Solid-State Circuits, vol. 35(12) Dec. 2000 pp. 2044-2054
1999 Philips	Jan Bosiers Agnes Kleimann Arjen Vander Sijde Laurens Korthout Daniel Verbugt	Herman Peek Edwin Roks Anco Heringa Frans Vledder Peter Opmeer	A 2/3” 2M pixel progressive scan FT-CCD for digital still camera applications Proc. 1998 IEEE International Electron Devices Meeting, pp. 37-40