Teranishi.jpgNobukazu Teranishi was born in 1953. He received the B.S. and M.S. degrees in physics from University of Tokyo, 1976 and 1978, respectively.

 

He was with NEC Corporation from 1978 to 2000, involved in the research and development of solid-state image sensors for visible and infrared. From 1986 to 1987, he stayed at Arizona State University as a visiting researcher to study quantum transport. In 2000, he joined Panasonic Corporation, and now he is a general manager in charge of marketing and application technology of image sensors.

 

He and his group invented the pinned photodiode technology, vertical overflow structure, and smear reduction structure. He has authored and co-authored 78 papers and has submitted 95 patents.

 

He won the Prize of the President of KEIDANREN of National Invention Awards in 1994, Commendation by Minister of State for Science and Technology in 1997, and Niwa-Takayanagi Award from the Institute of Image Information and Television Engineers in 2000. His group won the Technology Progress Award in 1986 from the Institute of Television Engineers of Japan, the Technology Award in 1986 from the Motion Picture and Television Society of Japan, the Emmy Award in 1991 from the Academy of Television Arts & Sciences. His group also won the Fujio Award in 1993 from the Institute of Television Engineers of Japan. He is selected as a Fellow of the Institute of Image Information and Television Engineers in 2003.  He was named a Fellow of the IEEE in 2010.

 

He served as a guest editor of IEEE Transactions on Electron Devices Special Issue on Solid-State Image Sensors in 1997 and 2003. He also served as a general chairman for the 1999 and 2005 IEEE Workshop on Charge-Coupled Devices & Advanced Image Sensors.  He co-founded International Image Sensor Workshop (IISW) in 2006, and will co-chair the 2011 IISW. At the Institute of Image Information and Television Engineers, he served as a chairman of the paper editorial committee and a chairman of the Information Sensing Committee. He is a program committee member of IS&T/SPIE Electronic Imaging.